SEKCE E - STANDARDIZACE, METROLOGIE A CHARAKTERIZACE NANOMATERIÁLŮ
Datum: 7.11.2014
Místo konání: Kongresový sál C
9:30 - 12:30
09:30 - 10:00 | ||
E1 | RISS Alexander | Vienna University of Technology, Institute of Applied Physics, Vienna, Austria, EU |
Single-molecule Reactions – Imaging Chemical Bonds and Tuning Electronic Structure - VYŽÁDANÁ PŘEDNÁŠKA | ||
10:00 - 10:15 | ||
E2 | PIKAL Petr | Precheza a.s., Prerov, Czech Republic, EU |
Particle Size Measurement – Lessons learned from EU Nanomaterial Definition | ||
10:15 - 10:30 | ||
E3 | MACHALA Libor | Palacky University in Olomouc, Olomouc, Czech Republic, EU |
57Fe Mössbauer Spectroscopy in Studying of Iron Containing Nanostructures | ||
10:45 - 11:15 | ||
E4 | KUŽEL Petr | Institute of Physics of the ASCR, v.v.i., Prague, Czech Republic, EU |
Transient Terahertz Conductivity in Nanoscaled Systems | ||
11:15 - 11:30 | ||
E5 | KLAPETEK Petr | Czech Metrology Institute, Brno, Czech Republic, EU |
Modeling of Light Interaction with Rough Nano-Objects | ||
11:30 - 11:45 | ||
E6 | FRANK Luděk | Institute of Scientific Instruments AS CR, v.v.i., Brno, Czech Republic, EU |
Examination of Graphene with Very Slow Electrons | ||
11:45 - 12:00 | ||
E7 | ČERMÁK Jan | Institute of Physics AS CR, v.v.i., Prague, Czech Republic, EU |
Microscopic Characterization of Graphene Electronic Quality Across Neighbouring, Differently Oriented Copper Grains | ||
12:00 - 12:15 | ||
E8 | TRUHLÁŘ Michal | Institute of Physics of Materials AS CR v.v.i., Brno, Czech Republic, EU |
Comparison of Different Measurement Method of Mechanical Properties of Al Thin Film | ||
12:15 - 12:30 | ||
E9 | MAŇÁK Jan | Institute of Physics of the ASCR, v.v.i., Prague, Czech Republic, EU |
The Effect of Crystallographic Orientation on Nanohardness and Elastic Modulus in Pure Magnesium and AZ31 Magnesium Alloy | ||
12:30 - 12:45 | ||
E10 | RICHTER Ivan | Czech Technical University in Prague, Faculty of Nuclear Sciences and Physical Engineering, Prague, Czech Republic, EU |
Approaches to Electromagnetic Simulations of Advanced SERS Substrates |